High-precision, non-contact measurement of surface texture
Nowadays, the properties of surface topographies are increasingly influenced by new processing methods and new materials. The traditional profile stylus method is often not adequate to characterize the functional behavior of surfaces. Three-dimensional recording and evaluation are required. Soft and thin-walled materials also require non-contact measurement. Moreover, ever higher levels of surface quality are being achieved, greatly increasing the requirements placed on measuring systems in terms of resolution and measuring accuracy. The MarSurf WS 1 satisfies all these requirements: • Vertical resolution 0.1 nm (.004 μin) • Three-dimensional measurement and evaluation in only a few seconds • Compact measuring station configuration for the workshop and laboratory • MarSurf XT 20 software • Topographical evaluation software on the fully standardized and powerful MarWin software platform |