Data
Order No
9999320
 EN
MarSurf WS 1


Measuring times of only a few seconds
• Saves time and money
Compact and simple design
• Saves money through low-cost entry and
  saves space in your inspection room or
  production environment
Accurate results
• Thanks to 0.1 nm (.004 μin) vertical
   resolution
• Thanks to compact, reliable design
• Thanks to tried-and-tested evaluation
   software from Mahr
MarSurf WS 1 gives you a competitive edge
• Innovation in optical surface metrology
• Excellent vibration absorption (patent
  pending)
• Very small sensor dimensions
• Can be used in the workshop and
   laboratory

Description


High-precision, non-contact measurement of surface texture

Nowadays, the properties of surface topographies are increasingly influenced by new processing methods and new materials.
The traditional profile stylus method is often not adequate to characterize the functional behavior of surfaces. Three-dimensional recording and evaluation are required. Soft and thin-walled materials also require non-contact measurement.
Moreover, ever higher levels of surface quality are being achieved, greatly increasing the requirements placed on measuring systems in terms of resolution and measuring accuracy.

The MarSurf WS 1 satisfies all these requirements:

• Vertical resolution 0.1 nm (.004 μin)
• Three-dimensional measurement and evaluation in only a few seconds
• Compact measuring station configuration for the workshop and laboratory
• MarSurf XT 20 software
• Topographical evaluation software on the fully standardized and powerful MarWin
   software platform

Applications


The MarSurf WS 1 can be used both in precision inspection rooms and production environments. Other optical measuring principles quickly reach their limits when measuring various types of surfaces.
Some cannot handle high surface reflectiveness while others cannot measure rough surfaces properly if, indeed, at all.
The MarSurf WS 1 and its innovative measuring signal evaluation enables analysis of both reflective and rough workpieces. For example, the high vertical resolution allows you to measure the surface roughness of optical components such as lenses or mirrors with sub-μm accuracy. You are also able to measure the texture of
micromechanical components. The material involved is irrelevant here.

  •  Glass
  •  Paper
  •  Varnish
  •  Metal
  •  Plastic
  •  Coatings 
  •  Liquids

    can be measured.

    The MarSurf XT 20 topography software is a powerful evaluation tool with a wide range of functions. Thanks to the standardized MarWin software platform, you are also able to enjoy the benefits of the tried-and-tested
    MarSurf XC 20 contour software.

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