World novelty at the Control: high-precision measuring stations MarSurf LD 130/ LD 260 – large measuring volume, innovative probe system, tremendous time savings For combined contour and roughness measurements, the application specialist Mahr has developed the new high-end measuring stations MarSurf LD 130 and LD 260. The high measuring and positioning speeds are excellent, as well as the innovative probe technology. The measuring stations provide a large measuring volume, long measuring distances and large measuring stroke. Users benefit from the measuring accuracy in the nanometer range and significantly save time thanks to the measuring velocities. Measuring tasks in many industries increasingly require the combination of contour and roughness depth measurements. This requires measuring devices with tremendous metrological performance: Resolutions in the sub-nanometer range and residual values of <20 nm Rz are just some of the necessary boundary conditions. Here Mahr sets new standards with the new measuring instruments MarSurf LD 130 and LD 260 - and builds upon the successful product line of the top product MarSurf LD 120. Both measuring stations have the proven benefits of MarSurf LD 120 that bring success: for example, magnetic probe arm holder, automatic probe arm changing unit, dynamic force regulation from 0.5 mN to 30 mN as well as the cross-product market-leading software platform MarWin. The two new measuring stations are additionally distinguished by significant enhancements that demonstrate the enormous potential for improvement in the measuring room, in the production, and in the automatic CNC measuring run. Now roughness and contour can be recorded in one measuring run. The high measuring speed of 10 mm/s and a traverse speed of 200 mm/s minimize the measuring times - depending on the measurement task, a time savings of 50% can be achieved. The probes in bionic design and made of new materials provide greater rigidity, lower vibration behavior and greater dynamics. Thanks to the magnetic holder and chip technology, they can be changed quickly and safely – with simultaneous probe arm recognition. Users of the measuring systems benefit from time savings in quality control and can therefore check considerably more work pieces. With the large measuring volume, measurement tasks can now be now solved that were previously not measurable. Thanks to the measurement accuracy, the production quality will increase at the same time and remain at a high level on the long-term. | 
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