Mahr http://www.mahr.com Mahr News-Feed © Mahr GmbH - Carl-Mahr-Str.1, D-37073 Göttingen, Germany - Tel. +49 551 7073 800 - info@mahr.com http://www.mahr.com/gif/lookandfeel/Mahr/mahr_logo.gif Mahr http://www.mahr.com 2015-04-16: Mahr Newsletter, Global http://www.mahr.com//en-us/?view=4&nld=1005&nl=112 http://www.mahr.com//en-us/?view=4&nld=1005&nl=112 -- 00:00:00.000 2015-01-01: MarForm MMQ 150 <span class='TextNormal'><table style="height: 1459px; width: 712px;" border="0" cellspacing="0" cellpadding="2" width="712"><tbody><tr><td width="304"> <img src="http://www.mahr.com/images/products/Metrology/marform/systems/formtester_mmq/mmq 150/MarForm--MMQ_150--BI--Overview--monitor-HGblue--640x480--144dpi.jpg" alt="" width="490" height="416" /></td><td width="18" valign="top"> </td><td valign="top"><p> </p><p>MarForm MMQ 150 - The entry-system in the world of cylindricity measurement.</p><p>The MMQ 150 is an automatic measuring machine for testing deviations of form <br />and position:</p><ul><li>For use in the production area or in the measuring room </li><li>Quick and easy handling </li><li>Measuring accuracy, optimized for cylindricity</li><li>Minimizes scrap, saves time and reduces production costs</li><li>maintenance-free high precise mechanical bearings</li></ul></td></tr><tr><td width="304"> </td><td width="18"> </td><td> </td></tr><tr><td colspan="3" bgcolor="#eeeeee">Features</td></tr><tr><td colspan="3"><p><br />MMQ 150 measuring station offers a complete solution for controlling deviations of form and positioning for the quality of your products. MMQ 150 has been developed in a compact style and is designed for high accuracy, speed and esay handling. Exclusive use of maintenance-free high precision mechanical bearings service and exchange of compressed air components are not necessary. Mechanical bearings in the rotation axis have proven successful for years in other Mahr formtesters e.g. desktop formtester MMQ 400 and reference formtester MFU 100. The interplay of the rotation table axis and vertical axis was optimized so that MMQ 150 is specially suitable for measuring cylindricity tolerance deviation.</p><p>The EasyFor measuring, control and evalution software is very simple to operate and does not require any programming knowledge in order to measure and protocol in a minimum of steps. With the help of the included tech-in progamming it is very easy to create program sequences with user specific record. You can comfortably save up to 32 different measuring tasks from the user interface EasyForm or by 3 final certificate feature keys in the control panel of the MMQ 150.</p><p>Overview of the most important features of MMQ 150:</p><ul><li>High-precision measuring axis (C)</li><li>Motorized measuring axis, vertical (Z)</li><li>Motorized positioning axis, horizontal (X) </li><li>Manual centring and tilting table  </li><li>Manual probe T20W</li><li>Intuitionally to handle All-in-One Touch Screen PC</li><li>Ergonomical operator panel, special measuring programs<br />can be started by pressing (P1, P2, P3)</li><li>Compact, spacesaving  design</li><li>EasyForm software is very simple to operate </li></ul></td></tr><tr><td colspan="3"> </td></tr><tr><td colspan="3" bgcolor="#eeeeee">Application</td></tr><tr><td colspan="3"><p><br />In addition to cylindricity, form and position deviations as per DIN/ISO 1101 can be determined as well as further features:</p><ul><li><span style="font-family: FrutigerBQ-Light; color: #231f20; font-size: xx-small;"><span style="font-size: 8pt; color: black; font-family: Verdana;">Roundness</span></span></li><li><span style="font-family: FrutigerBQ-Light; color: #231f20; font-size: xx-small;"><p class="MsoNormal" style="margin: 0cm 0cm 0pt; mso-layout-grid-align: none;"><span style="font-size: 8pt; color: black; font-family: Verdana;">Straightness</span></p></span></li><li><span style="font-family: FrutigerBQ-Light; color: #231f20; font-size: xx-small;"><p class="MsoNormal" style="margin: 0cm 0cm 0pt; mso-layout-grid-align: none;"><span style="font-size: 8pt; color: black; font-family: Verdana;">Flatness (from a polar trace)</span></p></span></li><li><span style="font-family: FrutigerBQ-Light; color: #231f20; font-size: xx-small;"><p class="MsoNormal" style="margin: 0cm 0cm 0pt; mso-layout-grid-align: none;"><span style="font-size: 8pt; color: black; font-family: Verdana;">Parallelism</span></p></span></li><li><span style="font-family: FrutigerBQ-Light; color: #231f20; font-size: xx-small;"><p class="MsoNormal" style="margin: 0cm 0cm 0pt; mso-layout-grid-align: none;"><span style="font-size: 8pt; color: black; font-family: Verdana;">Conicity / Taper</span></p></span></li><li><span style="font-family: FrutigerBQ-Light; color: #231f20; font-size: xx-small;"><p class="MsoNormal" style="margin: 0cm 0cm 0pt; mso-layout-grid-align: none;"><span style="font-size: 8pt; color: black; font-family: Verdana;">Concentricity, coaxiality</span></p></span></li><li><span style="font-family: FrutigerBQ-Light; color: #231f20; font-size: xx-small;"><p class="MsoNormal" style="margin: 0cm 0cm 0pt; mso-layout-grid-align: none;"><span style="font-size: 8pt; color: black; font-family: Verdana;">Run-out, total run-out</span></p></span></li><li><span style="font-family: FrutigerBQ-Light; color: #231f20; font-size: xx-small;"><p class="MsoNormal" style="margin: 0cm 0cm 0pt; mso-layout-grid-align: none;"><span style="font-size: 8pt; color: black; font-family: Verdana;">Cylindricity</span></p></span></li><li><span style="font-family: FrutigerBQ-Light; color: #231f20; font-size: xx-small;"><p class="MsoNormal" style="margin: 0cm 0cm 0pt; mso-layout-grid-align: none;"><span style="font-size: 8pt; color: black; font-family: Verdana;">Perpendicularity (from a polar trace)</span></p></span></li><li><span style="font-family: FrutigerBQ-Light; color: #231f20; font-size: xx-small;"><p class="MsoNormal" style="margin: 0cm 0cm 0pt; mso-layout-grid-align: none;"><span style="font-size: 8pt; color: black; font-family: Verdana;">Angularity</span></p></span></li><li><span style="font-family: FrutigerBQ-Light; color: #231f20; font-size: xx-small;"><p class="MsoNormal" style="margin: 0cm 0cm 0pt; mso-layout-grid-align: none;"><span style="font-size: 8pt; color: black; font-family: Verdana;">Angle sector (roundness, flatness, run-out)</span></p></span></li><li><span style="font-family: FrutigerBQ-Light; color: #231f20; font-size: xx-small;"><p class="MsoNormal" style="margin: 0cm 0cm 0pt; mso-layout-grid-align: none;"><span style="font-size: 8pt; color: black; font-family: Verdana;">Straightness evaluation sections</span></p></span></li></ul></td></tr><tr><td colspan="3"> </td></tr><tr bgcolor="#eeeeee"><td colspan="3">Components of the measuring station</td></tr><tr><td colspan="3"><br />MMQ 150 measuring station consists of: <ul><li>Formtester MarForm MMQ 150 </li><li>Probe T20W with probe arm </li><li>Easy Form measuring, control and evaluation software  </li><li>All-in-One Touch Screen PC 23",  i5-class, Windows 7</li><li>Color ink jet printer </li><li>Connection cable <br /><br />Options and accessories:</li><li>Rim chuck Ø 100 mm</li><li>Various clamping fixtures </li><li>Option Velocity analysis</li><li>Option commutator analysis</li><li>Probe arms with different lengths and probe ball geometries</li><li>Various double-probe arms</li><li>Various calibration standards</li><li>Different instruments desks, also with vibration isolation</li></ul></td></tr></tbody></table></span> http://www.mahr.com//en-us/?ContentID=16010 http://www.mahr.com//en-us/?ContentID=16010 2015-01-01 00:00:00.000 2013-11-01: MarSurf CWM 100 <span class='TextNormal'><table border="0" cellspacing="0" cellpadding="2" width="660"><tbody><tr><td width="305" valign="top"><img src="http://www.mahr.com/images/products/Metrology/marsurf/systems/stationary_instruments_pc_based/MarSurf--CWM_100--Waverbilder_1--320x240--72dpi.jpg" alt="" width="320" height="240" /></td><td width="15" valign="top"> </td><td width="300" valign="top"><p><strong>MarSurf CWM 100<br /><br /></strong>3D optical measurement system – confocal microscope with integrated white light interferometer – for measurement and evaluation of surface structures and small components</p><ul><li>High precision - non-contact measurement of surface structures</li><li>Your results are correct!</li><li>Fast measurement - short measuring time</li></ul></td></tr><tr><td width="304"> </td><td width="18"> </td><td> </td></tr><tr><td colspan="3" bgcolor="#eeeeee">Features</td></tr><tr><td colspan="3"><table border="0" cellspacing="0" cellpadding="2" width="640"><tbody><tr><td colspan="3"> </td></tr><tr><td colspan="3"><ul><li>For measurements on technical, optical and reflecting surfaces as well as on <span class="hps atn">printed circuit boards <span class="hps atn">(</span><span>semiconductor industry</span><span>)</span> a 3D topographical analysis (areal measurement) with high </span><span class="hps">information density</span> <span class="hps">is required. </span>Soft and thin-walled materials also require non-contact measurement. Moreover, ever higher levels of surface quality are being achieved, greatly increasing the requirements placed on measuring systems in terms of resolution and measuring accuracy.</li><li>Highly accurate and non-conatct measurement of surface structures.</li><li>High precision with sub-nanometer resolution</li><li>Main application field for the confocal sensor is the measurement of rough and dark surface structures and small components.</li><li>Main application field for the white light interferometer is the measurement of fine, polished and shiny surface structures including glass and optical surfaces </li><li>Microscope field of view, easily enlargeable by fully automated stitching procedure</li></ul></td></tr></tbody></table></td></tr><tr><td colspan="3"> </td></tr><tr><td colspan="3" bgcolor="#eeeeee">Application</td></tr><tr><td colspan="3"><table border="0" cellspacing="0" cellpadding="2" width="600"><tbody><tr><td colspan="3"> </td></tr><tr><td colspan="3"><ul><li>Metal surfaces</li></ul><table border="0" width="640"><tbody><tr><td><img src="http://www.mahr.com/images/products/Metrology/marsurf/systems/stationary_instruments_pc_based/MarSurf--Laserplättchen--pic320x240.jpg" alt="" width="320" height="240" /></td><td><img src="http://www.mahr.com/images/products/Metrology/marsurf/systems/stationary_instruments_pc_based/MarSurf--Laserplättchen1--pic320x240.jpg" alt="" width="320" height="240" /></td></tr><tr><td>Measurement and evaluation of laser-structured surfaces</td><td>Measurement and evaluation of rough and fine grinded surfaces</td></tr></tbody></table><br /><ul><li><span class="hps">Measurement and analysis of</span> <span class="hps">semiconductor</span> <span class="hps">wafers and</span> <span class="hps">components</span></li></ul><table border="0" width="640"><tbody><tr><td><img src="http://www.mahr.com/images/products/Metrology/marsurf/systems/stationary_instruments_pc_based/application--chip_structure--pic320x240.jpg" alt="" width="318" height="238" /></td><td><img src="http://www.mahr.com/images/products/Metrology/marsurf/systems/stationary_instruments_pc_based/application--bond_pads--pic320x240.jpg" alt="" width="320" height="240" /></td></tr></tbody></table><br /><ul><li>Optical surfaces</li></ul><table border="0" width="640"><tbody><tr><td><img src="http://www.mahr.com/images/products/Metrology/marsurf/systems/MarSurf_WM_100--detail--pic320x240.jpg" alt="" width="320" height="240" /></td><td><img src="http://www.mahr.com/images/products/Metrology/marsurf/systems/MarSurf_CWM_100-application--pic320x240.jpg" alt="" width="320" height="240" /></td></tr><tr><td colspan="2">Measurement and evaluation of sphere and asphere surfaces as well as microlenses </td></tr></tbody></table></td></tr></tbody></table></td></tr><tr><td colspan="3" bgcolor="#eeeeee">Software</td></tr><tr><td colspan="3"><table border="0" cellspacing="0" cellpadding="2" width="640"><tbody><tr><td colspan="3"> </td></tr><tr><td colspan="3"><ul><li>Measurement and evaluation software <strong>MarSurf IfM</strong> <ul><li>Easy and intuitive operation</li><li>Data import and export data in different formats</li><li>View as diagram profile section, topography, 3D</li><li>Calculation of roughness parameters according to DIN / ISO</li></ul></li><li>Evaluation software <strong>MarSurf MfM</strong> and <strong>MarSurf MfM plus</strong> <ul><li>Standard 2D roughness parameters as well as 3D surface parameters according to DIN/ISO can be determined quickly and easily along free selectable lines or surfaces or in excerpts.</li><li>The extremely flexible and highly varied 3D surface view provides a comprehensive overview of the measured surface area.</li></ul></li><li>Measurement and evaluation software  <strong>MarSurf Asphären</strong> <ul><li>With this software tool, the measured surface of spherical and aspherical lenses can be evaluated.</li></ul></li></ul></td></tr></tbody></table></td></tr><tr><td colspan="3"> </td></tr><tr bgcolor="#eeeeee"><td colspan="3">Description</td></tr><tr valign="top"><td colspan="3"><br /><span class="hps">The optical</span> <span class="hps">3D measurement</span> <span class="hps">system</span> <strong><span class="hps">MarSurf</span> <span class="hps">CWM</span> <span class="hps">100</span> </strong><span class="hps alt-edited">includes the following</span> <span class="hps">components</span>:<strong> </strong> <ul><li>Light source: High performance LED with λ = 505 nm</li><li>Sensors: confocal microscope and white light interferometer</li><li>Lens for confocal: 50x (numerical aperture 0.8)</li><li>Lens for white light interferometer: 20x (numerical aperture 0.4)</li><li>Object table 100 mm x,y; CNC controlled</li><li>Z-axis with 100 mm traversing range; CNC controlled</li><li>Measurement and evaluation software <strong>MarSurf IfM</strong> </li><li>Optional: other lenses for confocal microscope and white light interferometer</li><li>Optional: software <strong>MarSurf MfM</strong>; software <strong>MarSurf MfM plus</strong>; sftware <strong>MarSurf Asphären  </strong></li></ul></td></tr><tr><td colspan="3"> </td></tr></tbody></table></span> http://www.mahr.com//en-us/?ContentID=14752 http://www.mahr.com//en-us/?ContentID=14752 2013-11-01 00:00:00.000