Metrology
Metrology
MarSurf XCR 20 Roughness and contour measuring station
EN
  • Combined measuring station allows both surface roughness and contour measurements to be performed at a single measuring station
    - GD 25 drive unit for surface roughness measurements
    - PCV drive unit for contour measurements
    - The two measuring systems are fixed to the measuring stand by combi holder
  • Space-saving design: the two drive units can be adapted by means of the corresponding combi holder to MarSurf ST 500 or ST 750 measuring stands
  • Roughness and contour evaluation from a single measurement
  • High precision contour and roughness evaluation for components requiring a long stroke and very high resolution with the MarSurf LD 130 / LD 260 measuring system
  • Quick changeover between roughness and contour measurement by switching within the software platform and swapping mechanical components such as the drive unit and probe
  • Technical data
  • Applications
  • Accessories
  • Options
  • Versions
  • Shipment

Resolution

In Z, relative to stylus tip:
0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm)

In Z, relative to measuring system:
0.04 µm

Sampling angle
On smooth surfaces, depending on deflection:
trailing edges up to 88°, leading edges up to 77°
Start of traversing length (in X)
0.2 mm
Tip radius
25
Contacting speed (in Z)
0.1 to 1 mm/s
Probe arm length
175 mm, 350 mm
End of traversing length (in X)
200 mm
Positioning speed
In X and return speed: 0.2 to 8 mm/s
In Z: 0.2 to 10 mm/s
Guide deviation
< 1 µm (over 200 mm)
Measuring speed
0.2 mm/s to 4 mm/s
Measuring principle
Stylus method
Probe
R probe, MFW 250
Optical probe Focodyn*, LS 1*, LS 10*
(*only in conjunction with PGK or GD 120 CNC drive unit)
Measuring range mm
(in Z) 50 mm
MFW 250: ±25 µm, ±250 µm, (up to ±750 µm); ±1000 µin, ±10,000 µin (up to ±30,000 µin)
Traversing lengths
Automatic; 0.56 mm; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm,
(.022 / .070 / .224 / .700 / 2.240 in),
Measurement up to stop, variable
Number n of sampling length according to ISO/JIS
1 to 50 (default: 5)
Measuring force (N)
1 mN to 120 mN, below and above
(can be set in MarSurf XC 20)

Machine building
  • Bearings, threads, threaded rods, ball screws, shafts, racks, valves

  • Automotive industry
  • Steering, brake system, gearbox, crankshaft, camshaft, cylinder head, cylinder block, turbocharger

  • Medicine
  • Contour and surface roughness measurement for hip and knee endoprostheses
  • Contour measurement for medical screws
  • Contour and surface roughness measurement for dental implants

  • Aerospace
  • Turbine components

Optional:
  • MarSurf ST 750 measuring stand
  • Parallel V-block
  • Equipment table

Software options:
  • Profile processing
  • Dominant waviness
  • User defined parameters
  • Topography
  • QS-STAT / QS-STAT Plus
  • Thread evaluation

  • MarSurf PCV 200 contour drive unit
  • MarSurf GD 25 roughness drive unit

  • Combined measuring station with one measuring stand and two drive units (PCV 200 and MarSurf GD 25)
  • Combined measuring station with quick-change holders (GD 120, PCV 20)
  • MarSurf LD 130 / 260 for precision contour and roughness evaluation on components

  • MarSurf XCR (including PC), midrange standard, MarSurf XCR 20 software, Mahr license key
  • TFT monitor
  • MarSurf PCV 200 / MarSurf GD 25 drive unit
  • MarSurf ST 500 measuring stand (including combi holder)
  • Calibration set, PGN-3
  • MCP 21 manual control panel
  • CT 300 XY table