Metrology
Metrology
MarSurf XR 20 mit GD 25 Roughness measuring station
EN
• PC based instrument delivers all common surface parameters and profiles in accordance with international standards (both in measuring room and in production)
• Combines decades of experience in surface metrology with innovative technology
    - Easy to read icons
    - User friendly operator assistance
  • Over 100 surface parameters available for R, P and W profiles in accordance with ISO / JIS, ASME or MOTIF (ISO 12085)
  • Tolerance monitoring and statistics for all surface parameters
  • Internal program assistance for quick and easy measurements
  • Comprehensive measuring records
  • Automatic functions for choosing filter and traversing length in accordance with international standards
  • Support for various calibration methods (static/dynamic) by specifying the Ra or Rz parameter
  • Adjustable maintenance and calibration intervals
  • Simulation mode for rapid familiarization with operating principle
  • Multiple measuring station configurations for custom applications
  • Technical data
  • Applications
  • Accessories
  • Shipment

Measuring principle
Stylus method
Probe
R probe, MFW 250 B
Measuring range mm
MFW 250: ±25 µm, ±250 µm, (up to ±750 µm); ±1000 µin, ±10,000 µin (up to ±30,000 µin)
Filter according to ISO/JIS
filter as per ISO 16610-21(replaced gaussian filter as per ISO 11562), robust gaussian filter a per ISO 16610-31
Traversing lengths
Automatic; 0.56 mm; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm*,
Measurement up to stop, variable
* Traversing length dependent on drive unit
Number n of sampling length according to ISO/JIS
1 to 50 (default: 5)
Surface parameters
Over 100 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)

Machine building
  • Bearings, threads, threaded rods, ball screws, shafts, racks, valves

  • Automotive industry
  • Steering, brake system, gearbox, crankshaft, camshaft, cylinder head, cylinder block, turbocharger

  • Medicine
  • Surface roughness measurement for hip and knee endoprostheses

  • Aerospace
  • Turbine components

  • Optics
  • Various optical components

  • Parallel vise
  • V-block

General software options:
  • Dominant waviness (WDc) for MarWin
  • ISO 13565-3 surface parameters
  • QS-STAT / QS-STAT Plus
  • Profile processing
  • User defined parameters
  • Contour 1 for MarSurf XR 1 / XR 20

  • MarSurf XR 20 including PC, midrange standard, XR 20 software, Mahr license key
  • TFT monitor
  • MarSurf GD 25 drive unit
  • MFW 250 B probe system set
  • MarSurf ST-G measuring stand
  • PGN 3 calibration standard
  • MCP 23 manual control panel
  • CT 120 XY table