Stationary Instruments PC-based - Mahr Metrology

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Startpage | Products | Metrology | By Mahr Product Group | MarSurf | Systems | Stationary Instruments PC-based / WebCode 2564

MarSurf Stationary Instruments PC-based

		XR 20 MarWin
			Simply measuring of roughness and waviness Touch screen optional.

		XC 2 MarWin
			MarSurf XC 2 - For entry-level, high-precision contour measurement


		XC 20 MarWin
			MarSurf XC 20 is the new generation of the new Mahr philosophy regarding contour measurement and evaluation.

		XCR 20 MarWin
			The new generation of combined roughness and contour measuring philosophy.

		UD / LD 120 MarWin
			MarSurf UD / LD 120 is the new upper class high precision contour AND roughness measuring station with integrated optical measuring system. Roughness and contour are determined by only one stroke!

		XP 20 MarWin
			The professional entrance into automated surface metrology. By Mahr-owned software platform 'MarWin' a modularly designed system with many important advantages is applied. New CNC-Measuring stations: Automatic Probe Arm Changing Device TWE MarSurf LD 120 Aspheric CNC Surface and Contour Measuring Station for Shafts

		WS 1
			High-precision, non-contact measurement of surface texture using the principle of white-light interferometry

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